发明授权
- 专利标题: Semiconductor device and a method of manufacturing the same
- 专利标题(中): 半导体装置及其制造方法
-
申请号: US11388476申请日: 2002-04-08
-
公开(公告)号: US07351617B2公开(公告)日: 2008-04-01
- 发明人: Shunpei Yamazaki , Setsuo Nakajima , Ritsuko Kawasaki
- 申请人: Shunpei Yamazaki , Setsuo Nakajima , Ritsuko Kawasaki
- 申请人地址: JP
- 专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人: Semiconductor Energy Laboratory Co., Ltd.
- 当前专利权人地址: JP
- 代理机构: Cook, Alex, McFarron, Manzo, Cummings & Mehler, Ltd.
- 优先权: JP10-223883 19980807
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
To provide a technique required for purifying the interface between an active layer and an insulating film. On a substrate (101), a gate wiring (103) is formed and the surface thereof is covered with a gate oxide film (104). Then, a first insulating film (105a), a second insulating film (105b), a semiconductor film (106) and a protective film (107) are sequentially formed and layered without exposing them to the air. Further, the semiconductor film (106) is irradiated with laser light through the protective film (107). In this way, a TFT may be given good characteristics by completely purifying the interface of the semiconductor film.
公开/授权文献
信息查询
IPC分类: