Invention Grant
- Patent Title: Scanning laser thermal annealing
- Patent Title (中): 扫描激光热退火
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Application No.: US10021782Application Date: 2001-12-18
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Publication No.: US07351638B1Publication Date: 2008-04-01
- Inventor: Cyrus E. Tabery , Eric N. Paton , Bin Yu , Qi Xiang , Robert B. Ogle
- Applicant: Cyrus E. Tabery , Eric N. Paton , Bin Yu , Qi Xiang , Robert B. Ogle
- Applicant Address: US CA Sunnyvale
- Assignee: Advanced Micro Devices, Inc.
- Current Assignee: Advanced Micro Devices, Inc.
- Current Assignee Address: US CA Sunnyvale
- Agency: McDermott Will & Emery LLP
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A method of manufacturing a semiconductor device includes forming a gate electrode over a substrate, implanting dopants into the substrate and activating the dopants using laser thermal annealing. During annealing, the laser and substrate are moved relative to one another, and the movement of the laser and the substrate relative to one another does not pause between and during activating one portion of the source/drain regions and activating another portion of the source/drain regions. Each pulse from the laser can respectively irradiate different portions of the source/drain regions, and a spot area of the laser is less than 50 millimeter2.
Information query
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