发明授权
US07353472B2 System and method for testing pattern sensitive algorithms for semiconductor design
有权
用于半导体设计测试模式敏感算法的系统和方法
- 专利标题： System and method for testing pattern sensitive algorithms for semiconductor design
- 专利标题（中）： 用于半导体设计测试模式敏感算法的系统和方法
-
申请号： US11202591申请日： 2005-08-12
-
公开(公告)号： US07353472B2公开(公告)日： 2008-04-01
- 发明人: David L. DeMaris , Timothy G. Dunham , William C. Leipold , Daniel N. Maynard , Michael E. Scaman , Shi Zhong
- 申请人： David L. DeMaris , Timothy G. Dunham , William C. Leipold , Daniel N. Maynard , Michael E. Scaman , Shi Zhong
- 申请人地址： US NY Armonk
- 专利权人： International Business Machines Corporation
- 当前专利权人： International Business Machines Corporation
- 当前专利权人地址： US NY Armonk
- 代理机构： Hoffman, Warnick & D'Alessandro LLC
- 代理商 Richard M. Kotulak
- 主分类号： G06F17/50
- IPC分类号： G06F17/50
摘要：
A system and method for generating test patterns for a pattern sensitive algorithm. The method comprises the steps extracting feature samples from a layout design; grouping feature samples into clusters; selecting at least one area from the layout design that covers a feature sample from each cluster; and saving each pattern layout covered by the at least one area as test patterns.
公开/授权文献
信息查询
