Invention Grant
- Patent Title: Apparatus and method for detecting binary data
- Patent Title (中): 二进制数据检测装置及方法
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Application No.: US10870445Application Date: 2004-06-18
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Publication No.: US07356097B2Publication Date: 2008-04-08
- Inventor: Hyun-soo Park , Jae-seong Shim , Jae-wook Lee , Eing-seob Cho , Eun-jin Ryu
- Applicant: Hyun-soo Park , Jae-seong Shim , Jae-wook Lee , Eing-seob Cho , Eun-jin Ryu
- Applicant Address: KR Suwon-si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si
- Agency: Stein, McEwen & Bui, LLP
- Priority: KR10-2003-0039891 20030619; KR10-2004-0037259 20040525
- Main IPC: H03D1/00
- IPC: H03D1/00

Abstract:
A method and apparatus detecting binary data, the apparatus includes an analog-to-digital (AD) converter converting the input analog signal into a digital signal; at least one binarization unit converting the digital signal into binary data; a viterbi decoder performing viterbi decoding to detect binary data from the digital signal; and a level detector receiving the digital signal, receiving at least two binary data from one of the viterbi decoder and the at least one binarization unit, and detecting and outputting a level value for the viterbi decoding from the digital signal when a number of the at least two binary data, which correspond to each other on a time axis and have the same values, is equal to or greater than a predetermined number. Accordingly, it is possible to more precisely detect binary data from an analog signal.
Public/Granted literature
- US20050025261A1 Apparatus and method for detecting binary data Public/Granted day:2005-02-03
Information query
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