发明授权
- 专利标题: Compound semiconductor device and method of manufacturing the same
- 专利标题(中): 化合物半导体器件及其制造方法
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申请号: US11376547申请日: 2006-03-16
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公开(公告)号: US07358156B2公开(公告)日: 2008-04-15
- 发明人: Akira Tanaka , Masaaki Onomura , Seiji Iida , Takayuki Matsuyama
- 申请人: Akira Tanaka , Masaaki Onomura , Seiji Iida , Takayuki Matsuyama
- 申请人地址: JP Minato-ku, Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Minato-ku, Tokyo
- 代理机构: Banner & Witcoff, Ltd
- 优先权: JP2005-293840 20051006
- 主分类号: H01L21/00
- IPC分类号: H01L21/00
摘要:
A method of manufacturing a compound semiconductor device comprises forming a scribed groove extending from an edge of a major surface of a laminated body to an internal region on the first major surface. The laminated body has the first major surface and a second major surface and is formed by crystal growth of a compound semiconductor multilayer film on a substrate. The scribed groove is shallow at the edge and deep in the internal region. The method may further comprise separating the laminated body into first and second portions separated by a separation plane including the scribed groove by applying load to the second major surface of the laminated body.
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