Invention Grant
- Patent Title: Data processing apparatus and scheme for signal measurement
- Patent Title (中): 用于信号测量的数据处理装置和方案
-
Application No.: US11079993Application Date: 2005-03-14
-
Publication No.: US07359839B2Publication Date: 2008-04-15
- Inventor: Rong-Hwa Ding
- Applicant: Rong-Hwa Ding
- Applicant Address: TW Hsinchu
- Assignee: Solid State System Co., Ltd.
- Current Assignee: Solid State System Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: J.C. Patents
- Main IPC: G06F15/00
- IPC: G06F15/00

Abstract:
A measure system for signal measurement is introduced. The measure system simplifies the effort for a signal measurement in many applications. The application for a signal measurement is, for example, computation of a signal average value. The measure system includes a digital computation circuit together with an analog to digital converter (ADC) to constitute a compact signal measurement component. With the proposed design, a general microcontroller can proceed with a signal level sense and control with very few CPU power. In addition, the proposed system can be integrated with other analog or digital signal processing circuitry to form a single silicon chip.
Public/Granted literature
- US20060015551A1 Data processing apparatus and scheme for signal measurement Public/Granted day:2006-01-19
Information query