Invention Grant
US07362122B2 Method and circuit for extracting current-voltage characteristics of device
有权
提取器件电流 - 电压特性的方法和电路
- Patent Title: Method and circuit for extracting current-voltage characteristics of device
- Patent Title (中): 提取器件电流 - 电压特性的方法和电路
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Application No.: US11178167Application Date: 2005-07-08
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Publication No.: US07362122B2Publication Date: 2008-04-22
- Inventor: Wei-Cheng Lin , Kuo-Pei Lu , Yao-Wen Chang
- Applicant: Wei-Cheng Lin , Kuo-Pei Lu , Yao-Wen Chang
- Applicant Address: TW Hsinchu
- Assignee: MACRONIX International Co., Ltd.
- Current Assignee: MACRONIX International Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: J. C. Patents
- Main IPC: G01R31/26
- IPC: G01R31/26
Abstract:
A method and a circuit for extracting current-voltage characteristics employ two pulse signals with different duty cycles into a device to be measured in order to extracting current-voltage characteristics of the device to be measured. The present invention may reduce the self-heating effect of the device to be measured and increase the measurable range of the device to be measured.
Public/Granted literature
- US20070007931A1 Method and circuit for extracting current-voltage characteristics of device Public/Granted day:2007-01-11
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