A sensing circuit determines whether an integrated circuit is currently exposed to one of a relatively low or a relatively high temperature. A selection circuit selects a measured voltage across the base-emitter of a bipolar transistor if the sensing circuit indicates that the circuit is exposed to the relatively low temperature or, alternatively, selects a measured delta voltage across the base-emitter of the bipolar transistor if the sensing circuit indicates that the circuit is exposed to the relatively high temperature. A comparator compares the selected measured voltage against a first reference voltage indicative of a too cold temperature condition or compares the selected measured delta voltage against a second reference voltage indicative of a too hot temperature condition. As a result of the comparison, detection may be made as to whether the integrated circuit is currently exposed to a too cold or too hot temperature.