Invention Grant
- Patent Title: Stokes parameter measurement device and method
- Patent Title (中): 斯托克斯参数测量装置及方法
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Application No.: US11139777Application Date: 2005-05-31
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Publication No.: US07369232B2Publication Date: 2008-05-06
- Inventor: Mieko Yamagaki , Yu Mimura , Kazuyou Mizuno , Takeshi Takagi
- Applicant: Mieko Yamagaki , Yu Mimura , Kazuyou Mizuno , Takeshi Takagi
- Applicant Address: JP Tokyo
- Assignee: The Furukawa Electric Co., Ltd.
- Current Assignee: The Furukawa Electric Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, P.C.
- Priority: JP2002-8330 20020117; JP2002-201268 20020710
- Main IPC: G01J4/00
- IPC: G01J4/00

Abstract:
An object is to accurately measure the Stokes parameters, without the occurrence of polarization fluctuations or PDL during the splitting of the incident light. When the incident light is made incident on a first-stage prism, the light is split into two first splitting light rays. Next, the first split light rays are respectively incident on a pair of prisms of a second stage. Each of the pair of first split light rays is split into two rays by a second-stage prism, to obtain four second split light rays.
Public/Granted literature
- US20050270529A1 Stokes parameter measurement device and method Public/Granted day:2005-12-08
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