发明授权
US07372632B2 Apparatus and methods for the inspection of microvias in printed circuit boards 失效
用于检查印刷电路板中微孔的装置和方法

Apparatus and methods for the inspection of microvias in printed circuit boards
摘要:
An imaging method and imaging system for inspecting features located at a known inter-feature pitch on portions of a target surface. The system includes a lens array having a plurality of lenses wherein the lenses of the lens array have an inter-lens pitch and an inter-field of view pitch corresponding to the inter-feature pitch, and an array of imaging elements having an inter-element pitch corresponding to the inter-feature pitch, whereby the imaging system images only field of view areas of the target surface containing features.
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