Invention Grant
US07372754B2 Method and apparatus for controlling slope of word line voltage in nonvolatile memory device
有权
用于控制非易失性存储器件中字线电压斜率的方法和装置
- Patent Title: Method and apparatus for controlling slope of word line voltage in nonvolatile memory device
- Patent Title (中): 用于控制非易失性存储器件中字线电压斜率的方法和装置
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Application No.: US11354917Application Date: 2006-02-16
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Publication No.: US07372754B2Publication Date: 2008-05-13
- Inventor: Sang-Won Hwang , Jin-Wook Lee
- Applicant: Sang-Won Hwang , Jin-Wook Lee
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, PLLC
- Priority: KR10-2005-0068028 20050726
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A nonvolatile memory device includes a nonvolatile memory cell array including a plurality of nonvolatile memory cells connected to a plurality of word lines, a word line voltage generator configured to generate first and second sequences of voltage pulses. The device selectively supplies one of the first and second sequences of voltage pulses to a selected one of the word lines to program the nonvolatile memory cells connected to the selected word line. A slope of at least one voltage pulse of the first sequence of voltage pulses is greater than a slope of at least one voltage pulse of the second sequence of voltage pulses. In general, the first sequence is applied to word lines far away from the string select line (SSL), and the second sequence is applied to word lines that are close to the SSL.
Public/Granted literature
- US20070025155A1 Method and apparatus for controlling slope of word line voltage in nonvolatile memory device Public/Granted day:2007-02-01
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