Invention Grant
US07375595B2 Method and apparatus for calibrating a phase locked loop in open-loop
有权
用于校准开环中的锁相环的方法和装置
- Patent Title: Method and apparatus for calibrating a phase locked loop in open-loop
- Patent Title (中): 用于校准开环中的锁相环的方法和装置
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Application No.: US11540878Application Date: 2006-09-29
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Publication No.: US07375595B2Publication Date: 2008-05-20
- Inventor: Louie Serrano , Alireza Zolfaghari , Paul Lettieri , Hea Joung Kim , Hooman Darabi , Henrik Jensen , Behnam Mohammadi
- Applicant: Louie Serrano , Alireza Zolfaghari , Paul Lettieri , Hea Joung Kim , Hooman Darabi , Henrik Jensen , Behnam Mohammadi
- Applicant Address: US CA Irvine
- Assignee: Broadcom Corporation
- Current Assignee: Broadcom Corporation
- Current Assignee Address: US CA Irvine
- Main IPC: H03L7/08
- IPC: H03L7/08 ; H03L7/099

Abstract:
Methods and apparatus for calibrating a transitional loop, such as a phase locked loop, are disclosed. An example method includes performing an open loop calibration of a voltage controlled oscillator (VCO). The open loop calibration includes tuning the output oscillation frequency of the VCO to within a predetermined range of frequencies. The example method further includes determining a voltage offset and a gain error of an analog to digital converter (ADC) coupled with the phase locked loop. The example method also includes determining a gain offset of the open loop calibrated VCO using the voltage offset and the gain error of the ADC. In the example method, a signal provided by a charge pump of the PLL is adjusted based on the determined gain offset.
Public/Granted literature
- US20080079509A1 METHOD AND APPARATUS FOR CALIBRATING A PHASE LOCKED LOOP IN OPEN-LOOP. Public/Granted day:2008-04-03
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