Invention Grant
- Patent Title: Methods for electrochemically fabricating multi-layer structures including regions incorporating maskless, patterned, multiple layer thickness depositions of selected materials
- Patent Title (中): 用于电化学制造多层结构的方法,包括掺入所选材料的无掩模,图案化,多层厚度沉积的区域
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Application No.: US10841001Application Date: 2004-05-07
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Publication No.: US07384530B2Publication Date: 2008-06-10
- Inventor: Adam L. Cohen , Dennis R. Smalley
- Applicant: Adam L. Cohen , Dennis R. Smalley
- Applicant Address: US CA Van Nuys
- Assignee: Microfabrica Inc.
- Current Assignee: Microfabrica Inc.
- Current Assignee Address: US CA Van Nuys
- Agent Dennis R. Smalley
- Main IPC: C25D5/02
- IPC: C25D5/02 ; C25D5/48

Abstract:
The invention includes methods of fabrication and apparatuses. In at least some embodiments of the applicants' invention, the methods include processes of: maskless selective deposition of non-layered structures, selective etching and/or deposition without use of a separate mask and/or lithography techniques, retaining selected portions of sacrificial material during removal (e.g. etching) of other portions of sacrificial material, depositing materials other than the structural and sacrificial materials, including more than one type of structural and/or sacrificial material, and fabrication of interlacing elements. Embodiments of the methods of the invention provide increased capabilities, properties, flexibility and in the fabrication of three-dimensional structures by electro-deposition or other techniques. In certain embodiments, the apparatuses of the invention include structures having non-layered elements, retained sacrificial materials, three or more different deposited materials, and interlaced elements.
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