Invention Grant
US07388942B2 X-ray micro-tomography system optimized for high resolution, throughput, image quality
有权
针对高分辨率，吞吐量，图像质量优化的X射线微层析成像系统
- Patent Title: X-ray micro-tomography system optimized for high resolution, throughput, image quality
- Patent Title (中): 针对高分辨率，吞吐量，图像质量优化的X射线微层析成像系统
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Application No.: US11682503Application Date: 2007-03-06
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Publication No.: US07388942B2Publication Date: 2008-06-17
- Inventor: Yuxin Wang , Wenbing Yun , David Dean Scott
- Applicant: Yuxin Wang , Wenbing Yun , David Dean Scott
- Applicant Address: US CA Concord
- Assignee: Xradia, Inc.
- Current Assignee: Xradia, Inc.
- Current Assignee Address: US CA Concord
- Agency: Houston Eliseeva LLP
- Main IPC: A61B6/03
- IPC: A61B6/03
Abstract:
A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.
Public/Granted literature
- US20070147583A1 X-Ray Micro-Tomography System Optimized for High Resolution, Throughput, Image Quality Public/Granted day:2007-06-28
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