Invention Grant
- Patent Title: Integrated fluxgate-induction sensor
- Patent Title (中): 集成磁通门感应传感器
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Application No.: US11219664Application Date: 2005-09-07
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Publication No.: US07391210B2Publication Date: 2008-06-24
- Inventor: Yongming Zhang , Andrew D. Hibbs , Robert Earl Grimm
- Applicant: Yongming Zhang , Andrew D. Hibbs , Robert Earl Grimm
- Applicant Address: US CA San Diego
- Assignee: QUASAR Federal Systems, Inc.
- Current Assignee: QUASAR Federal Systems, Inc.
- Current Assignee Address: US CA San Diego
- Agency: Diederiks & Whitelaw, PLC
- Main IPC: G01R33/02
- IPC: G01R33/02 ; G01R33/04

Abstract:
An integrated fluxgate-induction sensor is formed of a combined fluxgate sensor and induction sensor using a common core. The sensor may be in serial operation where it switches between a fluxgate mode for measuring static magnetic fields and an induction mode for measuring alternating magnetic fields. Additionally, the sensor may be used in an interleaved operation where the sensor operates from the fluxgate mode during the transition period where its core is changing from a high permeability state to a low permeability state or vice versa, while the sensor operates in the induction mode when the core is in its high permeability state. The resulting sensor provides for a compact magnetic sensor system capable of sensing magnetic fields which oscillate from zero frequency to 10 kHz and higher.
Public/Granted literature
- US20060181272A1 Integrated fluxgate-induction sensor Public/Granted day:2006-08-17
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