发明授权
- 专利标题: Manufacturing method of monocrystalline gallium nitride localized substrate
- 专利标题(中): 单晶氮化镓局部衬底的制造方法
-
申请号: US11055985申请日: 2005-02-14
-
公开(公告)号: US07393763B2公开(公告)日: 2008-07-01
- 发明人: Katsutoshi Izumi , Motoi Nakao , Yoshiaki Ohbayashi , Keiji Mine , Seisaku Hirai , Fumihiko Jobe , Tomoyuki Tanaka
- 申请人: Katsutoshi Izumi , Motoi Nakao , Yoshiaki Ohbayashi , Keiji Mine , Seisaku Hirai , Fumihiko Jobe , Tomoyuki Tanaka
- 申请人地址: JP Osaka-shi JP Yao-shi
- 专利权人: Osaka Prefecture,Hosiden Corporation
- 当前专利权人: Osaka Prefecture,Hosiden Corporation
- 当前专利权人地址: JP Osaka-shi JP Yao-shi
- 代理机构: Kratz, Quintos & Hanson, LLP
- 优先权: JP2002-341046 20021125
- 主分类号: H01L21/36
- IPC分类号: H01L21/36
摘要:
There is provided a monocrystalline gallium nitride localized substrate suitable for manufacturing electronic-optical united devices in which electronic devices and optical devices are mixedly mounted on the same silicon substrate.An area in which monocrystalline gallium nitride 410 is grown is locally present on a silicon substrate 100 by forming silicon carbide 200 on the silicon substrate 100 to locally form the monocrystalline gallium nitride 410 on the above-mentioned silicon carbide 200. Silicon nitride 220 is used as a mask in forming the above-mentioned monocrystalline gallium nitride 410.
公开/授权文献
信息查询
IPC分类: