发明授权
- 专利标题: Defect estimation apparatus and related method
- 专利标题(中): 缺陷估计装置及相关方法
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申请号: US11306360申请日: 2005-12-25
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公开(公告)号: US07395462B2公开(公告)日: 2008-07-01
- 发明人: Wei-Hsiang Tseng , Hsin-Cheng Chen , Ping-Sheng Chen
- 申请人: Wei-Hsiang Tseng , Hsin-Cheng Chen , Ping-Sheng Chen
- 申请人地址: TW Hsin-Chu Hsien
- 专利权人: MediaTek Inc.
- 当前专利权人: MediaTek Inc.
- 当前专利权人地址: TW Hsin-Chu Hsien
- 代理商 Winston Hsu
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
A weighted defect estimating apparatus and a related method for determining a defect estimation value are disclosed. The weighted defect detecting apparatus includes: a defect detecting unit for generating a defect value when a defect in a predetermined region of an optical disc is detected; a weighting circuit, electrically connected to the defect detecting unit, to generate a weighted defect value according to the defect value and a weighting factor corresponding to a location of the defect on the optical disc; and a computing module, electrically connected to the weighting circuit, for computing the defect estimation value according to a plurality of weighted defect values corresponding to the predetermined region.
公开/授权文献
- US20070150212A1 DEFECT ESTIMATION APPARATUS AND RELATED METHOD 公开/授权日:2007-06-28