Invention Grant
- Patent Title: Automated quality control method and system for genetic analysis
- Patent Title (中): 自动质量控制方法和遗传分析系统
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Application No.: US11428048Application Date: 2006-06-30
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Publication No.: US07398171B2Publication Date: 2008-07-08
- Inventor: David C. Woo , Yerramalli Subramaniam
- Applicant: David C. Woo , Yerramalli Subramaniam
- Applicant Address: US CA Foster City
- Assignee: Applera Corporation
- Current Assignee: Applera Corporation
- Current Assignee Address: US CA Foster City
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G06F17/40

Abstract:
Aspects of the present invention describe a method and apparatus for automating quality control for gene expression data. A computer based device receives gene expression data associated with a spectral species and genetic sample in each well of a plate. Gene expression data may be received from a sequence detection instrument performing one or more gene expression related operations for each of the wells of the plate. The computer based device identifies gene expression data determined to have anomalous characteristics according to a set of one or more quality control metrics and may conditionally flag one or more wells of the plate affected by the anomalous characteristics. Filters can then be selectively applied to temporarily or permanently remove the flagged data from subsequent gene expression studies.
Public/Granted literature
- US20070010951A1 Automated quality control method and system for genetic analysis Public/Granted day:2007-01-11
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