发明授权
- 专利标题: Circuit board with quality-indicator mark and method for indicating quality of the circuit board
- 专利标题(中): 具有质量指示标记的电路板和指示电路板质量的方法
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申请号: US10935870申请日: 2004-09-07
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公开(公告)号: US07402755B2公开(公告)日: 2008-07-22
- 发明人: Chien-Te Chen , Chih-Hao Chang
- 申请人: Chien-Te Chen , Chih-Hao Chang
- 申请人地址: TW
- 专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人: Siliconware Precision Industries Co., Ltd.
- 当前专利权人地址: TW
- 代理机构: Edwards Angell Palmer & Dodge LLP
- 代理商 Peter F. Corless; Steven M. Jensen
- 优先权: TW093112723 20040506
- 主分类号: H05K1/00
- IPC分类号: H05K1/00
摘要:
A circuit board with a quality-indicator mark and a method for indicating quality of the circuit board. The circuit board includes a plurality of circuit board units. A plating bus is formed around each circuit board unit and extended to form a plating trace in an inner-layer circuit structure of each circuit board unit. The inner-layer circuit structure is inspected in quality to maintain or break connection between the plating trace and plating bus if the quality is good or not. At least one circuit structure is formed on the inner-layer circuit structure and electrically connected to the plating trace to form a conductive mark on each circuit board unit. A metal protection layer is formed on the at least one circuit structure via the plating bus, and the conductive mark with the metal protection layer indicates that the inner-layer circuit structure of the circuit board unit is good.
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