Invention Grant
- Patent Title: Apparatus for detecting chemical substances and method therefor
- Patent Title (中): 用于检测化学物质的装置及其方法
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Application No.: US11324231Application Date: 2006-01-04
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Publication No.: US07408153B2Publication Date: 2008-08-05
- Inventor: Hisashi Nagano , Izumi Waki , Yasuaki Takada
- Applicant: Hisashi Nagano , Izumi Waki , Yasuaki Takada
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Reed Smith LLP
- Agent Stanley P. Fisher, Esq.; Juan Carlos A. Marquez, Esq.
- Priority: JP2003-329294 20030922
- Main IPC: H01J44/04
- IPC: H01J44/04 ; G01N24/00

Abstract:
An apparatus for detecting chemical substances which is high in sensitivity and selectivity is provided.An organic acid or an organic acid salt is used to generate an organic acid gas from an organic acid gas generator 3 to be mixed with a sample gas for introduction into an ion source 4 for ionization, thereby obtaining a mass spectrum by a mass analysis region 5. A data processor 6 determines the detection or non-detection of a specific m/z of an organic acid adduct ion obtained by adding a molecule generated from the organic acid to a molecule with specific m/z generated from a target chemical substance to be detected based on the obtained mass spectrum. When there is an ion peak with the m/z of the organic acid adduct ion, the presence of the target chemical substance to be detected is determined, and an alarm is sounded.False detection can be prevented.
Public/Granted literature
- US20060108522A1 Apparatus for detecting chemical substances and method therefor Public/Granted day:2006-05-25
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