Invention Grant
- Patent Title: Lithographic apparatus and method for calibrating the same
- Patent Title (中): 平版印刷设备及其校准方法
-
Application No.: US11822633Application Date: 2007-07-09
-
Publication No.: US07408655B2Publication Date: 2008-08-05
- Inventor: Erik Roelof Loopstra , Leon Martin Levasier , Rene Oesterholt
- Applicant: Erik Roelof Loopstra , Leon Martin Levasier , Rene Oesterholt
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G01B11/14
- IPC: G01B11/14

Abstract:
Lithographic apparatus includes a substrate table and a motion control system for controlling a movement of the substrate table. The motion control system includes at least 3 position detectors constructed for detecting a position of the substrate table. For measuring a position and orientation of the substrate table, each position detector comprises an optical encoder of a single dimensional or multi dimensional type, the optical encoders being arranged for providing together at least 6 position values, at least one position value being provided for each of the 3 dimensions. 3 or more of the at least 3 optical encoders being connected to the substrate table at different locations in the 3 dimensional coordinate system. The motion control system is arranged to calculate the position of the substrate table in the 3 dimensional coordinate system from a subset of at least 3 of the 6 position values and to calculate an orientation of the substrate table with respect to the coordinate system from another subset of at least 3 of the 6 position values. Further, a method for calibrating the position detectors is described.
Public/Granted literature
- US20070256471A1 Lithographic apparatus and method for calibrating the same Public/Granted day:2007-11-08
Information query