发明授权
US07414904B2 Method for evaluating storage cell design using a wordline timing and cell access detection circuit
失效
使用字线定时和单元访问检测电路评估存储单元设计的方法
- 专利标题: Method for evaluating storage cell design using a wordline timing and cell access detection circuit
- 专利标题(中): 使用字线定时和单元访问检测电路评估存储单元设计的方法
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申请号: US11609598申请日: 2006-12-12
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公开(公告)号: US07414904B2公开(公告)日: 2008-08-19
- 发明人: Sebastian Ehrenreich , Jente B Kuang , Chun-Tao Li , Hung Cai Ngo
- 申请人: Sebastian Ehrenreich , Jente B Kuang , Chun-Tao Li , Hung Cai Ngo
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理商 Mitch Harris, Atty at Law, LLC; Andrew M. Harris; Casimer K. Salys
- 主分类号: G11C7/00
- IPC分类号: G11C7/00
摘要:
A method for storage cell design evaluation provides accurate information about state changes in static storage cells. A wordline select pulse is propagated along the wordline select path of the test row to an output driver circuit, in order to test the clock and/or address timing of the row, so that variation of access timing, read stability and writeability with wordline strength/access voltage can be determined. An access detection cell holds the input of the output driver circuit until a simulated access operation activated by the wordline select pulse is complete. Multiple test rows may be cascaded among columns to provide a long delay line or ring oscillator for improved measurement resolution.
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