- 专利标题: High-endurance memory device
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申请号: US11701886申请日: 2007-02-02
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公开(公告)号: US07420845B2公开(公告)日: 2008-09-02
- 发明人: Yue-Der Chih
- 申请人: Yue-Der Chih
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Co., Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: K & L Gates LLP
- 主分类号: G11C16/06
- IPC分类号: G11C16/06
摘要:
A memory device includes a set of memory cells, each of which is capable of being selected to generate a sensing current depending on a logic state thereof, and a set of reference cells, each of which is capable of being selected to generate a reference current. A sense amplifier is coupled to the memory cells and the reference cells for comparing the sensing current with the reference current to generate a signal representing the logic state of the selected memory cell. The memory cells and the reference cells are subject to the same operation cycles, such that a difference between the sensing current and the reference current remains a constant.
公开/授权文献
- US20080186774A1 High-endurance memory device 公开/授权日:2008-08-07
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