Invention Grant
- Patent Title: Exposure apparatus and device manufacturing method
- Patent Title (中): 曝光装置和装置制造方法
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Application No.: US11387682Application Date: 2006-03-24
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Publication No.: US07423724B2Publication Date: 2008-09-09
- Inventor: Noriyasu Hasegawa , Tatsuya Hayashi , Yoshikazu Miyajima
- Applicant: Noriyasu Hasegawa , Tatsuya Hayashi , Yoshikazu Miyajima
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2005-088934 20050325
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/52

Abstract:
An exposure apparatus exposes a substrate to light via a reticle in a vacuum. A projection optical system projects a pattern of the reticle onto the substrate, a stage holds the substrate and moves, and first and second partitions define an exhaust space between a first space accommodating at least a part of the projection optical system and a stage space accommodating the stage. The first partition includes a first opening to make the light pass between the first space and the exhaust space, and the second partition includes a second opening to make the light pass between the exhaust space and the stage space. A first supply system supplies fluid into the stage space, and a first exhaust system recovers fluid from the stage space through the second opening and the exhaust space. A pressure in the exhaust space is lower than those in the first space and the stage space.
Public/Granted literature
- US20060215137A1 Exposure apparatus and device manufacturing method Public/Granted day:2006-09-28
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