发明授权
- 专利标题: Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity
- 专利标题(中): 使用电光腔的可变衰减信号采集探测和电压测量系统
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申请号: US11681709申请日: 2007-03-02
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公开(公告)号: US07424177B2公开(公告)日: 2008-09-09
- 发明人: Christopher P. Yakymyshyn , Timothy R. Piwonka-Corle , William Q. Law , William A. Hagerup
- 申请人: Christopher P. Yakymyshyn , Timothy R. Piwonka-Corle , William Q. Law , William A. Hagerup
- 申请人地址: US OR Beaverton
- 专利权人: Tektronix, Inc.
- 当前专利权人: Tektronix, Inc.
- 当前专利权人地址: US OR Beaverton
- 代理商 Willaim K. Bucher
- 主分类号: G02B6/00
- IPC分类号: G02B6/00
摘要:
A variable attenuation signal acquisition probing system and voltage measurement system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode structure having apertures formed in the optical cavity that are parallel to propagation path of the optical signal within the cavity. A modulated optical signal is generated by the optical cavity in response to the signal under test creating an electro-magnetic field distribution in electro-optic material in the optical cavity that overlaps the optical path of the optical signal propagating in the optical cavity which varies the index of refraction of electro-optic material in the optical path. Changes in the polarization state of the optical signal attenuates the magnitude of the output electrical signal of the optical receiver.
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