Signal analysis system and calibration method
    1.
    发明授权
    Signal analysis system and calibration method 有权
    信号分析系统和校准方法

    公开(公告)号:US07460983B2

    公开(公告)日:2008-12-02

    申请号:US11508460

    申请日:2006-08-23

    IPC分类号: G06F19/00 G06F17/40

    摘要: A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.

    摘要翻译: 一种适于校准信号分析系统的信号路径的方法和装置,使得系统的加载效应基本上从被测设备的测量中移除。 来自被测器件的被测信号被耦合到信号路径中的测试探头,并与测试探头中的可选阻抗负载一起使用,以表征被测器件的传输参数。 频率或时域中的均衡滤波器由被测器件的传输参数计算,用于减少归因于被测器件测量负载的信号误差。

    CALIBRATED S-PARAMETER MEASUREMENTS OF A HIGH IMPEDANCE PROBE
    2.
    发明申请
    CALIBRATED S-PARAMETER MEASUREMENTS OF A HIGH IMPEDANCE PROBE 有权
    高阻抗探测器的校准S参数测量

    公开(公告)号:US20080278176A1

    公开(公告)日:2008-11-13

    申请号:US12117461

    申请日:2008-05-08

    IPC分类号: G01R35/00

    CPC分类号: G01R27/32 G01R35/005

    摘要: A new methodology for the measurement of the S-parameters of a high impedance probe allows obtaining a full two port S-parameter set for the high impedance probe. The measured probe S-parameters are then used for characterization of probes. An alternative method characterizes half of the fixture and termination as a one-port network and expanding it into a two-port error box. The two-port error box is then cascaded with the probe input.

    摘要翻译: 用于测量高阻抗探头的S参数的新方法可以获得用于高阻抗探针的完整的两端S参数集。 然后将测量的探针S参数用于探针的表征。 另一种方法是将灯具的一半和终端设置为单端口网络,并将其扩展为双端口错误盒。 双端口错误框然后与探头输入级联。

    Signal acquisition probing system using a micro-cavity laser
    3.
    发明授权
    Signal acquisition probing system using a micro-cavity laser 有权
    信号采集探测系统采用微腔激光器

    公开(公告)号:US07187187B2

    公开(公告)日:2007-03-06

    申请号:US11077692

    申请日:2005-03-10

    IPC分类号: G01R31/302 G01R31/308

    CPC分类号: G01R15/241 G01R1/071

    摘要: A signal acquisition probing system uses a micro-cavity laser to acquire an electrical signal from a device under test. The micro-cavity laser has a VCSEL gain medium and an electro-optic optical resonant cavity. The micro-cavity laser is pumped by an external laser source and generates a frequency modulated optical signal derived from the device under test electrical signal creating an electro-magnetic field distribution in electro-optic material in the micro-cavity laser that overlaps the optical path of the optical signal propagating in the electro-optic material. The frequency modulated optical signal is coupled to an optical receiver which converts the frequency modulated optical signal to an electrical signal. The electrical signal is coupled to measurement test instrument for processing and displaying of the electrical signal.

    摘要翻译: 信号采集探测系统使用微腔激光器从被测设备获取电信号。 微腔激光器具有VCSEL增益介质和电光学光学谐振腔。 微腔激光器被外部激光源泵浦,并产生从被测器件电信号得到的调频光信号,从而产生与光路重叠的微腔激光器中的电光材料中的电磁场分布 的光信号在电光材料中传播。 调频光信号耦合到将调频光信号转换成电信号的光接收器。 电信号耦合到测量测试仪器,用于处理和显示电信号。

    Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity
    4.
    发明授权
    Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity 有权
    使用电光腔的可变衰减信号采集探测和电压测量系统

    公开(公告)号:US07424177B2

    公开(公告)日:2008-09-09

    申请号:US11681709

    申请日:2007-03-02

    IPC分类号: G02B6/00

    摘要: A variable attenuation signal acquisition probing system and voltage measurement system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode structure having apertures formed in the optical cavity that are parallel to propagation path of the optical signal within the cavity. A modulated optical signal is generated by the optical cavity in response to the signal under test creating an electro-magnetic field distribution in electro-optic material in the optical cavity that overlaps the optical path of the optical signal propagating in the optical cavity which varies the index of refraction of electro-optic material in the optical path. Changes in the polarization state of the optical signal attenuates the magnitude of the output electrical signal of the optical receiver.

    摘要翻译: 可变衰减信号采集探测系统和电压测量系统使用光学腔来获取被测信号。 探测系统具有通过光传输系统耦合到光腔的光发射器和接收器。 光腔具有在光腔中形成的孔,其平行于空腔内的光信号的传播路径。 响应于被测信号,由光腔产生调制的光信号,从而在光腔中的电光材料中产生与在光腔中传播的光信号的光路重叠的电磁场分布, 电光材料在光路中的折射率。 光信号的偏振状态的变化衰减光接收器的输出电信号的幅度。

    Wide bandwidth attenuator input circuit for a measurement probe
    5.
    发明授权
    Wide bandwidth attenuator input circuit for a measurement probe 有权
    用于测量探头的宽带衰减器输入电路

    公开(公告)号:US07402991B2

    公开(公告)日:2008-07-22

    申请号:US11693628

    申请日:2007-03-29

    IPC分类号: G01R1/20

    摘要: A wide bandwidth attenuator input circuit for a measurement probe has a Z0 attenuator circuit coupled in series with a compensated RC attenuator circuit. The series attenuator elements of the Z0 and the compensated RC attenuator circuits are coupled via a controlled impedance transmission line to the shunt attenuator elements of the Z0 and the compensated RC attenuator circuits. The shunt element of the Z0 attenuator element terminates the transmission line in its characteristic impedance. The junction of the series and shunt attenuator elements are coupled to the input of a buffer amplifier. At low and intermediate frequencies, the compensated RC attenuator circuit attenuates an input signal while at high frequencies, the compensated RC attenuator circuit acts as a short and the Z0 attenuator circuits attenuates the input signal.

    摘要翻译: 用于测量探头的宽带衰减器输入电路具有与补偿的RC衰减器电路串联耦合的Z <0> 0 衰减器电路。 Z 0的串联衰减器元件和经补偿的RC衰减器电路通过受控阻抗传输线耦合到Z 0的分流衰减器元件和经补偿的RC衰减器 电路。 Z&lt; 0&gt;衰减器元件的分路元件在其特性阻抗中终止传输线。 串联和分流衰减器元件的结点耦合到缓冲放大器的输入端。 在低频和中频频率下,补偿的RC衰减器电路在高频时衰减输入信号,补偿后的RC衰减器电路作为短路,而Z <0> 0衰减器电路衰减输入信号。

    Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity
    6.
    发明授权
    Variable attenuation signal acquisition probing and voltage measurement systems using an electro-optical cavity 有权
    使用电光腔的可变衰减信号采集探测和电压测量系统

    公开(公告)号:US07310455B2

    公开(公告)日:2007-12-18

    申请号:US11077788

    申请日:2005-03-10

    IPC分类号: G02B6/00 G02F1/07

    摘要: A variable attenuation signal acquisition probing system and voltage measurement system uses an optical cavity to acquire a signal under test. The probing system has an optical transmitter and receiver that are coupled to the optical cavity via an optical transmission system. The optical cavity has an electrode structure having apertures formed in the optical cavity that are parallel to propagation path of the optical signal within the cavity. A modulated optical signal is generated by the optical cavity in response to the signal under test creating an electromagnetic field distribution in electro-optic material in the optical cavity that overlaps the optical path of the optical signal propagating in the optical cavity which varies the index of refraction of electro-optic material in the optical path. Changes in the polarization state of the optical signal attenuates the magnitude of the output electrical signal of the optical receiver.

    摘要翻译: 可变衰减信号采集探测系统和电压测量系统使用光学腔来获取被测信号。 探测系统具有通过光传输系统耦合到光腔的光发射器和接收器。 光腔具有在光腔中形成的孔,其平行于空腔内的光信号的传播路径。 响应于被测信号,由光腔产生调制的光信号,从而在光腔中的电光材料中产生与在光腔中传播的光信号的光路重叠的电磁场分布, 电光材料在光路中的折射。 光信号的偏振状态的变化衰减光接收器的输出电信号的幅度。

    Attachable/detachable probing tip system for a measurement probing system
    7.
    发明授权
    Attachable/detachable probing tip system for a measurement probing system 有权
    用于测量探测系统的可附接/可拆卸探测尖端系统

    公开(公告)号:US07056134B2

    公开(公告)日:2006-06-06

    申请号:US10856230

    申请日:2004-05-27

    IPC分类号: G01R31/02

    摘要: A attachable/detachable probing tip system (10) has a housing (12) that includes a probing tip mounting member (14) and opposing substantially orthogonal attachment (16, 18) arms extending from the probing tip mounting member. The attachment arms define an inner surface of the probing tip mounting member in which is disposed at least a first a non-compressive set, resilient member (56). First and second probing tips (42, 44) are disposed over the non-compressive, resilient member (56) and secured to the housing by latching means (60, 66, 92, 96, 100, 130). The attachable/detachable probing tip system allows mounting of the probing tips (42, 44) to probing contacts on a device under test without a probe body or probing tip member (38) being attached. The attachment arms (16, 18) allows a probe body or probing tip member (38) to be attached and detached to the probing tip system (10). The probing tip member (38) includes contact pins that engage contact areas (82, 82, 92) of the probing tips (42, 44).

    摘要翻译: 可附接/可拆卸探测尖端系统(10)具有壳体(12),该壳体包括探测尖端安装构件(14)和从探测尖端安装构件延伸的相对的基本正交的附件(16,18)臂。 连接臂限定探测尖端安装构件的内表面,其中至少设置有第一非压缩组合弹性构件(56)。 第一和第二探测尖端(42,44)设置在非压缩弹性构件(56)上方并且通过锁定装置(60,66,92,96,100,130)固定到壳体。 可附接/可拆卸探测尖端系统允许将探测尖端(42,44)安装在被测设备上的探测触点上,而无需探测主体或探测尖端部件(38)被附接。 附接臂(16,18)允许探针主体或探测尖端构件(38)被附接并分离到探测尖端系统(10)。 探测尖端构件(38)包括接合引脚,其接合探测尖端(42,44)的接触区域(82,82,92)。

    High speed differential attenuator using a low temperature co-fired ceramic substrate
    8.
    发明授权
    High speed differential attenuator using a low temperature co-fired ceramic substrate 有权
    高速差分衰减器采用低温共烧陶瓷基板

    公开(公告)号:US06373348B1

    公开(公告)日:2002-04-16

    申请号:US09637173

    申请日:2000-08-11

    IPC分类号: H03H1124

    摘要: A high speed differential attenuator is formed on low temperature co-fired ceramic substrate structure having first and second parallel resistor-capacitor divider networks with each divider network having first and second parallel resistors and capacitors. The substrate has first and second dielectric layers with the top surface of the first dielectric layer having a voltage potential lead formed thereon for receiving an integrated circuit device. Each divider network further has first and second conductive elements formed on the top surface of the first dielectric layer functioning as first capacitive plates for the first and second capacitors. A third conductive element is disposed between the first and second dielectric layers and positioned beneath the first conductive element functioning as the other capacitive plate for the first capacitor. A fourth conductive element is disposed between the first and second dielectric layers and positioned beneath both of the second conductive elements of the divider networks and the voltage potential lead and functions as the other capacitive plate for the second capacitors of the divider networks and as a heat transfer layer. At least a first thermally conductive via is formed between the top and bottom surfaces of the second dielectric layer and below the voltage potential lead with the via thermally coupled to the fourth conductive element. The thermal via or vias may be thermally coupled to a heat sink disposed adjacent to the bottom surface of the second dielectric layer.

    摘要翻译: 在具有第一和第二并联电阻器 - 电容器分压器网络的低温共烧陶瓷衬底结构上形成高速差分衰减器,每个分压网络具有第一和第二并联电阻器和电容器。 衬底具有第一和第二电介质层,其中第一介电层的顶表面具有形成在其上的电压电位引线用于接收集成电路器件。 每个分压网络还具有形成在第一电介质层的顶表面上的第一和第二导电元件,其用作第一和第二电容器的第一电容板。 第三导电元件设置在第一和第二电介质层之间并且位于用作第一电容器的另一电容板的第一导电元件下方。 第四导电元件设置在第一和第二电介质层之间,并且位于分隔网络的第二导电元件和电压电位引线之下,并且用作分隔网络的第二电容器的另一个电容板,并作为热 转移层。 至少第一导热通孔形成在第二电介质层的顶表面和底表面之间,并且在通过热耦合到第四导电元件的通孔的下方形成电压电位引线。 热通孔或通孔可以热耦合到邻近第二电介质层的底表面设置的散热器。

    Calibrated S-parameter measurements of a high impedance probe
    9.
    发明授权
    Calibrated S-parameter measurements of a high impedance probe 有权
    高阻抗探头的校准S参数测量

    公开(公告)号:US07994801B2

    公开(公告)日:2011-08-09

    申请号:US12117461

    申请日:2008-05-08

    IPC分类号: G01R35/00 G01D18/00

    CPC分类号: G01R27/32 G01R35/005

    摘要: A new methodology for the measurement of the S-parameters of a high impedance probe allows obtaining a full two port S-parameter set for the high impedance probe. The measured probe S-parameters are then used for characterization of probes. An alternative method characterizes half of the fixture and termination as a one-port network and expanding it into a two-port error box. The two-port error box is then cascaded with the probe input.

    摘要翻译: 用于测量高阻抗探头的S参数的新方法允许获得用于高阻抗探针的完整的两端S参数集。 然后将测量的探针S参数用于探针的表征。 另一种方法是将灯具的一半和终端设置为单端口网络,并将其扩展为双端口错误盒。 双端口错误框然后与探头输入级联。