发明授权
- 专利标题: Optimization of detection systems using a detection error tradeoff analysis criterion
- 专利标题(中): 使用检测误差权衡分析标准优化检测系统
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申请号: US10151352申请日: 2002-05-19
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公开(公告)号: US07424425B2公开(公告)日: 2008-09-09
- 发明人: Jiri Navratil , Ganesh N. Ramaswamy
- 申请人: Jiri Navratil , Ganesh N. Ramaswamy
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Ference & Associates LLC
- 主分类号: G10L15/00
- IPC分类号: G10L15/00
摘要:
In detection systems, such as speaker verification systems, for a given operating point range, with an associated detection “cost”, the detection cost is preferably reduced by essentially trading off the system error in the area of interest with areas essentially “outside” that interest. Among the advantages achieved thereby are higher optimization gain and better generalization. From a measurable Detection Error Tradeoff (DET) curve of the given detection system, a criterion is preferably derived, such that its minimization provably leads to detection cost reduction in the area of interest. The criterion allows for selective access to the slope and offset of the DET curve (a line in case of normally distributed detection scores, a curve approximated by mixture of Gaussians in case of other distributions). By modifying the slope of the DET curve, the behavior of the detection system is changed favorably with respect to the given area of interest.
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