Invention Grant
- Patent Title: Charged particle beam apparatus
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Application No.: US10838342Application Date: 2004-05-05
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Publication No.: US07425702B2Publication Date: 2008-09-16
- Inventor: Yuko Sasaki , Mitsugu Sato
- Applicant: Yuko Sasaki , Mitsugu Sato
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2003-131026 20030509
- Main IPC: H01J37/244
- IPC: H01J37/244

Abstract:
When conditions for an electron gun mainly represented by extraction voltage V1 and accelerating voltage V0 are changed, a charged particle beam is once focused on a fixed position by means of a condenser lens and a virtual cathode position is calculated from a lens excitation of the condenser lens at that time and the mechanical positional relation of the electron gun to set an optical condition. For more accurate setting of the optical condition, a deflecting electrode device is provided at a crossover position of the condenser lens and a voltage is applied to the deflecting electrode device at a constant period so as to control the lens excitation of the condenser lens such that the amount of movement of an image is minimized on an image display unit such as CRT.
Public/Granted literature
- US20040222376A1 Charged particle beam apparatus Public/Granted day:2004-11-11
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