发明授权
US07425714B2 Measurement method of electron beam current, electron beam writing system and electron beam detector
有权
电子束电流,电子束写入系统和电子束检测器的测量方法
- 专利标题: Measurement method of electron beam current, electron beam writing system and electron beam detector
- 专利标题(中): 电子束电流,电子束写入系统和电子束检测器的测量方法
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申请号: US11207710申请日: 2005-08-22
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公开(公告)号: US07425714B2公开(公告)日: 2008-09-16
- 发明人: Makoto Sakakibara , Yoshinori Nakayama , Hiroya Ohta , Yasunari Sohda , Noriyuki Tanaka , Yasuhiro Someda
- 申请人: Makoto Sakakibara , Yoshinori Nakayama , Hiroya Ohta , Yasunari Sohda , Noriyuki Tanaka , Yasuhiro Someda
- 申请人地址: JP Tokyo JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation,Canon Kabushiki Kaisha
- 当前专利权人: Hitachi High-Technologies Corporation,Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo JP Tokyo
- 代理机构: Reed Smith LLP
- 代理商 Stanley P. Fisher, Esq.; Juan Carlos A. Marquez, Esq.
- 优先权: JP2004-261776 20040909
- 主分类号: G21K5/10
- IPC分类号: G21K5/10
摘要:
A technology capable of reducing the influence of the noise overlapped in a long transmission line when accurately measuring weak beam current in an electron beam writing system and capable of accurately and efficiently measuring weak beam current in a beam writing system using multiple beams is provided. With using a switch for connecting and disconnecting an electron beam detecting device and a detected signal line, the electron beam detecting device is disconnected from the detected signal line to accumulate the detected signals in the electron beam detecting device during the beam current measurement. Simultaneously with the finish of the measurement, the electron beam detecting device and the detected signal line are connected to measure the accumulated signals. Also, in order to simultaneously perform the measurement method, a plurality of electron beam detecting devices and switches are used to simultaneously measure a plurality of electron beams with high accuracy.
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