Invention Grant
- Patent Title: Optically balanced instrument for high accuracy measurement of dimensional change
- Patent Title (中): 用于高精度测量尺寸变化的光学平衡仪器
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Application No.: US11338127Application Date: 2006-01-23
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Publication No.: US07426039B2Publication Date: 2008-09-16
- Inventor: Vivek G Badami , Steven R Patterson
- Applicant: Vivek G Badami , Steven R Patterson
- Applicant Address: US NY Corning
- Assignee: Corning Incorporated
- Current Assignee: Corning Incorporated
- Current Assignee Address: US NY Corning
- Agent Timothy M. Schaeberle
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
An instrument for measuring dimensional changes in materials, such as ultra-low thermal expansion materials, contains an optically balanced measuring loop. Both an object beam and a loop beam propagate around the measuring loop. The object beam encounters both opposite side surfaces of the test object and the loop beam encounters remaining components of the measuring loop in common with the object beam. The object and loop beams can be separately compared to reference beams for producing heterodyne signal beams.
Public/Granted literature
- US20060132794A1 Optically balanced instrument for high accuracy measurement of dimensional change Public/Granted day:2006-06-22
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