Invention Grant
- Patent Title: Apparatus for ascertaining the light power level of a light beam, and scanning microscope
- Patent Title (中): 用于确定光束的光功率水平的装置和扫描显微镜
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Application No.: US10854987Application Date: 2004-05-27
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Publication No.: US07428043B2Publication Date: 2008-09-23
- Inventor: Ingo Boehm , Frank Schreiber
- Applicant: Ingo Boehm , Frank Schreiber
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Darby & Darby
- Priority: DE10324478 20030530
- Main IPC: G01J1/42
- IPC: G01J1/42 ; G01J3/42 ; G01J3/447 ; G01J3/28
Abstract:
An apparatus for ascertaining properties of a light beam, comprises a means for splitting a measured beam out from the light beam and comprises at least one detector that at least partially receives the measured beam. A polarization-influencing means is arranged in the beam path of the measured beam in order to enhance reliability and reproducibility.
Public/Granted literature
- US20040239929A1 Apparatus for ascertaining the light power level of a light beam, and scanning microscope Public/Granted day:2004-12-02
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