发明授权
- 专利标题: X-ray CT apparatus
- 专利标题(中): X射线CT装置
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申请号: US11534126申请日: 2006-09-21
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公开(公告)号: US07428290B2公开(公告)日: 2008-09-23
- 发明人: Akihiko Nishide , Akira Hagiwara , Yasuhiro Imai , Makoto Gohno
- 申请人: Akihiko Nishide , Akira Hagiwara , Yasuhiro Imai , Makoto Gohno
- 申请人地址: US WI Waukesha
- 专利权人: GE Medical Systems Global Technology Company, LLC
- 当前专利权人: GE Medical Systems Global Technology Company, LLC
- 当前专利权人地址: US WI Waukesha
- 代理机构: Armstrong Teasdale LLP
- 优先权: JP2005-280512 20050927
- 主分类号: H05G1/60
- IPC分类号: H05G1/60
摘要:
The present invention is intended to improve image quality ensured by a conventional (axial) scan, a cine scan, or a helical scan performed by an X-ray CT apparatus including a two-dimensional area X-ray detector that has a matrix structure. In helical scan image reconstruction based in three-dimensional image reconstruction performed in an X-ray CT apparatus including a two-dimensional area X-ray detector that is represented by a multi-array X-ray detector or a flat-panel X-ray detector and that has a matrix structure, an image expressing a slice thickness larger than the width of one detector array included in a multi-array X-ray detector is reconstructed according to either of a method of convoluting a z-direction filter to projection data items in the direction of detector arrays (z direction) and a method of convoluting a filer to a tomographic image space in the z direction. The two methods are optimized in terms of a calculation time and tomographic image quality. Consequently, a tomographic image can be quickly reconstructed with high quality.
公开/授权文献
- US20070071160A1 X-RAY CT APPARATUS 公开/授权日:2007-03-29
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