Invention Grant
- Patent Title: X-ray CT apparatus
- Patent Title (中): X射线CT装置
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Application No.: US11534126Application Date: 2006-09-21
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Publication No.: US07428290B2Publication Date: 2008-09-23
- Inventor: Akihiko Nishide , Akira Hagiwara , Yasuhiro Imai , Makoto Gohno
- Applicant: Akihiko Nishide , Akira Hagiwara , Yasuhiro Imai , Makoto Gohno
- Applicant Address: US WI Waukesha
- Assignee: GE Medical Systems Global Technology Company, LLC
- Current Assignee: GE Medical Systems Global Technology Company, LLC
- Current Assignee Address: US WI Waukesha
- Agency: Armstrong Teasdale LLP
- Priority: JP2005-280512 20050927
- Main IPC: H05G1/60
- IPC: H05G1/60

Abstract:
The present invention is intended to improve image quality ensured by a conventional (axial) scan, a cine scan, or a helical scan performed by an X-ray CT apparatus including a two-dimensional area X-ray detector that has a matrix structure. In helical scan image reconstruction based in three-dimensional image reconstruction performed in an X-ray CT apparatus including a two-dimensional area X-ray detector that is represented by a multi-array X-ray detector or a flat-panel X-ray detector and that has a matrix structure, an image expressing a slice thickness larger than the width of one detector array included in a multi-array X-ray detector is reconstructed according to either of a method of convoluting a z-direction filter to projection data items in the direction of detector arrays (z direction) and a method of convoluting a filer to a tomographic image space in the z direction. The two methods are optimized in terms of a calculation time and tomographic image quality. Consequently, a tomographic image can be quickly reconstructed with high quality.
Public/Granted literature
- US20070071160A1 X-RAY CT APPARATUS Public/Granted day:2007-03-29
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