Invention Grant
- Patent Title: Blade probe and blade probe card
- Patent Title (中): 刀片探头和刀片探针卡
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Application No.: US11711319Application Date: 2007-02-26
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Publication No.: US07432728B2Publication Date: 2008-10-07
- Inventor: Habib Kilicaslan , David F. McDevitt , Bahadir Tunaboylu , David T. Beatson
- Applicant: Habib Kilicaslan , David F. McDevitt , Bahadir Tunaboylu , David T. Beatson
- Applicant Address: SG Singapore
- Assignee: SV Probe Pte Ltd.
- Current Assignee: SV Probe Pte Ltd.
- Current Assignee Address: SG Singapore
- Agency: Hickman Palermo Truong & Becker LLP
- Agent Edward A. Becker
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A blade probe card includes a plurality of blades that each includes a first end connected to a printed circuit board and a second end. A probe member is attached to the second end of each blade and extends outward to make contact with a device under test. A ground member is attached to the second end of each blade. The blade probe card also includes a common ground member that is separate from the printed circuit board and coupled to the ground member of each blade. Each blade may also include a first conductive signal trace and two or more conductive ground traces formed on a surface of each blade. The first conductive signal trace electrically connects the probe member to a contact on the printed circuit board. The two or more conductive ground traces are adjacent to the conductive signal trace and reduce crosstalk between the blades.
Public/Granted literature
- US20070210815A1 Blade probe and blade probe card Public/Granted day:2007-09-13
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