Invention Grant
US07433032B2 Method and apparatus for inspecting defects in multiple regions with different parameters
有权
用于检查具有不同参数的多个区域中的缺陷的方法和装置
- Patent Title: Method and apparatus for inspecting defects in multiple regions with different parameters
- Patent Title (中): 用于检查具有不同参数的多个区域中的缺陷的方法和装置
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Application No.: US11253028Application Date: 2005-10-17
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Publication No.: US07433032B2Publication Date: 2008-10-07
- Inventor: Joung-Soo Kim , Sang-Mun Chon , Chung-Sam Jun , Yu-Sin Yang
- Applicant: Joung-Soo Kim , Sang-Mun Chon , Chung-Sam Jun , Yu-Sin Yang
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Marger Johnson & McCollom, P.C.
- Priority: KR10-2004-0083401 20041019
- Main IPC: G01B15/00
- IPC: G01B15/00 ; G01N21/00

Abstract:
In a method of inspecting defects, a first actual region of an actual object is inspected based on a first characteristic parameter as an inspection condition. A point where an inspection region of the actual object is changed into a second actual region from the first actual region is determined. The second actual region is then inspected based on a second characteristic parameter as the inspection condition. The first and second parameters may include contrast of a light that is reflected from a reference object, intensity of the light, brightness of the light, a size of a minute structure on the reference object, etc. The characteristic parameters of each reference region on the reference object are set. Thus, the defects may be accurately classified so that a time and a cost for reviewing the defects may be markedly reduced.
Public/Granted literature
- US20060082766A1 Method of inspecting defects and apparatus for performing the same Public/Granted day:2006-04-20
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