发明授权
- 专利标题: Highly specialized scenarios in random test generation
- 专利标题(中): 随机测试生成中的高度专业化场景
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申请号: US11085791申请日: 2005-03-21
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公开(公告)号: US07434101B2公开(公告)日: 2008-10-07
- 发明人: Allon Adir , Roy Emek , Itai Jaeger , Eitan Marcus , Tzach Schechner
- 申请人: Allon Adir , Roy Emek , Itai Jaeger , Eitan Marcus , Tzach Schechner
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
Improvements in functional verification of a design are achieved by providing a test template that specifies test parameters directed to a function of the design. An exemption mode of operation is associated with a portion of the template, in which constraints and variables associated with the template are revised. The template is an input to a CSP engine, which, in cooperation with a test generator engine, produces test scenarios that lie in an expanded region of the generator's usual operational space. Provision is made for independently enabling and disabling a plurality of exemption modes of operation that are associated with the same or different areas of the template.
公开/授权文献
- US20060212756A1 Highly specialized scenarios in random test generation 公开/授权日:2006-09-21
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