发明授权
- 专利标题: Method for manufacturing semiconductor device
- 专利标题(中): 制造半导体器件的方法
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申请号: US11376402申请日: 2006-03-15
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公开(公告)号: US07435445B2公开(公告)日: 2008-10-14
- 发明人: Cheol Ho Shin , Byoung Ha Cho , Sang Tae Sim , Jung Soo Kim , Won Hyung Lee , Dae Sik Kim
- 申请人: Cheol Ho Shin , Byoung Ha Cho , Sang Tae Sim , Jung Soo Kim , Won Hyung Lee , Dae Sik Kim
- 申请人地址: KR Chungcheongnam-Do
- 专利权人: Moohan Co., Ltd.
- 当前专利权人: Moohan Co., Ltd.
- 当前专利权人地址: KR Chungcheongnam-Do
- 代理机构: Bell, Boyd & Lloyd LLP
- 优先权: KR2002-56390 20020917
- 主分类号: C23C16/00
- IPC分类号: C23C16/00
摘要:
Disclosed are PEALD (plasma-enhanced atomic layer deposition) apparatus and PEALD method for manufacturing a semiconductor device, the PEALD apparatus comprising: a housing including a reaction chamber in which a deposition reaction is performed; a rotary disk unit installed in the housing and provided with a plurality of susceptors for receiving wafers thereon so as to move the wafers; a gas spray unit mounted on the upper end of the housing above the rotary disk unit, and provided with first reactive gas sprayers, second reactive gas sprayers and inert gas sprayers on a lower surface of a circular disk for spraying respective gases into the housing; a gas feed unit connected to the gas spray unit for supplying first and second reactive gases and a purge gas into the housing; a gas exhaust port formed around the rotary disk unit; and a plasma generator for generating plasma to excite the second reactive gas.
公开/授权文献
- US20060177579A1 Method for manufacturing semiconductor device 公开/授权日:2006-08-10
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