Invention Grant
US07436698B2 MRAM arrays and methods for writing and reading magnetic memory devices
有权
MRAM阵列和写入和读取磁存储器件的方法
- Patent Title: MRAM arrays and methods for writing and reading magnetic memory devices
- Patent Title (中): MRAM阵列和写入和读取磁存储器件的方法
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Application No.: US11610739Application Date: 2006-12-14
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Publication No.: US07436698B2Publication Date: 2008-10-14
- Inventor: Wen-Chin Lin , Denny Tang , Li-Shyue Lai , Chao-Hsiung Wang , Fan-Shi Jordan Lai
- Applicant: Wen-Chin Lin , Denny Tang , Li-Shyue Lai , Chao-Hsiung Wang , Fan-Shi Jordan Lai
- Applicant Address: TW Hsinchu
- Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
- Current Assignee Address: TW Hsinchu
- Agency: Baker & McKenzie LLP
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A non-destructive technique and related array for writing and reading magnetic memory cells, including sampling a first signal of a selected read line corresponding to select memory cells, applying a magnetic field to the select memory cells, sampling a second signal of the selected read line, and comparing the first and second signals to determine a logic state of the select memory cells.
Public/Granted literature
- US20070091672A1 MRAM arrays and methods for writing and reading magnetic memory devices Public/Granted day:2007-04-26
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