发明授权
US07437644B2 Automatic self-testing of an internal device in a closed system 有权
在封闭系统中对内部设备进行自动自检

Automatic self-testing of an internal device in a closed system
摘要:
A closed system such as a TET system in which self-testing of all components of the implantable medical device whose malfunction could negatively impact on the proper operation of the closed system is automatically and periodically performed without triggering from an external device. In addition, a closed system including automatic, periodic self-testing of the implantable medical device in which, whenever practical, testing of the components is synchronized with telemetric communication of the external device whereby an external RF field generated by the external device is used to supply necessary power to perform self-testing.
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