发明授权
- 专利标题: Automatic self-testing of an internal device in a closed system
- 专利标题(中): 在封闭系统中对内部设备进行自动自检
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申请号: US10978247申请日: 2004-10-29
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公开(公告)号: US07437644B2公开(公告)日: 2008-10-14
- 发明人: Alec Ginggen , Rocco Crivelli
- 申请人: Alec Ginggen , Rocco Crivelli
- 申请人地址: CH Le Locle
- 专利权人: Codman Neuro Sciences Sárl
- 当前专利权人: Codman Neuro Sciences Sárl
- 当前专利权人地址: CH Le Locle
- 代理机构: Cheryl F. Cohen, LLC
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
A closed system such as a TET system in which self-testing of all components of the implantable medical device whose malfunction could negatively impact on the proper operation of the closed system is automatically and periodically performed without triggering from an external device. In addition, a closed system including automatic, periodic self-testing of the implantable medical device in which, whenever practical, testing of the components is synchronized with telemetric communication of the external device whereby an external RF field generated by the external device is used to supply necessary power to perform self-testing.
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