Invention Grant
- Patent Title: Device for testing an analog-to-digital converter
- Patent Title (中): 用于测试模数转换器的装置
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Application No.: US11588857Application Date: 2006-10-27
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Publication No.: US07443322B2Publication Date: 2008-10-28
- Inventor: Eric Compagne
- Applicant: Eric Compagne
- Applicant Address: FR Meylan
- Assignee: Dolphin Integration
- Current Assignee: Dolphin Integration
- Current Assignee Address: FR Meylan
- Agency: Howard IP Law Group PC
- Priority: FR0553295 20051028
- Main IPC: H03M1/10
- IPC: H03M1/10

Abstract:
A device for testing an analog-to-digital converter providing a digital signal at a given sampling frequency, comprising a unit for providing a test signal to the converter, the test signal being a periodic signal comprising frequency components only at a fundamental frequency and at harmonics of the fundamental frequency, the fundamental frequency being a multiple of one quarter of the sampling frequency; a filter capable of receiving the digital signal and of rejecting the fundamental frequency to provide a filtered digital signal; and a unit capable of receiving the digital signal and the filtered digital signal and of providing a signal representative of the ratio between the effective powers of the digital signal and of the filtered digital signal.
Public/Granted literature
- US20070111670A1 Device for testing an analog-to-digital converter Public/Granted day:2007-05-17
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