Invention Grant
- Patent Title: Method of manufacturing a capacitor and method of manufacturing a dynamic random access memory device using the same
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Application No.: US11898667Application Date: 2007-09-14
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Publication No.: US07449383B2Publication Date: 2008-11-11
- Inventor: Kwang-Sub Yoon , Jung-Hyeon Lee , Bong-Cheol Kim , Se-Young Park
- Applicant: Kwang-Sub Yoon , Jung-Hyeon Lee , Bong-Cheol Kim , Se-Young Park
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce P.L.C.
- Priority: KR10-2006-0089056 20060914
- Main IPC: H01L21/8242
- IPC: H01L21/8242

Abstract:
In a method of manufacturing a capacitor and a method of manufacturing a dynamic random access memory device, an insulating layer covering an upper portion of a conductive layer may be provided with an ozone gas so as to change the property of the upper portion of the insulating layer. The upper portion of the insulating layer may be chemically removed to expose the upper portion of the conductive layer. The exposed upper portion of the conductive layer may be removed so as to transform the conductive layer into a lower electrode. The remaining portion of the insulating layer may be removed, and an upper electrode may be formed on the lower electrode.
Public/Granted literature
Information query
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