发明授权
- 专利标题: Specified object detection apparatus
- 专利标题(中): 指定物体检测装置
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申请号: US11003004申请日: 2004-12-02
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公开(公告)号: US07457432B2公开(公告)日: 2008-11-25
- 发明人: Haizhou Ai , Chang Huang , Bo Wu , Shihong Lao
- 申请人: Haizhou Ai , Chang Huang , Bo Wu , Shihong Lao
- 申请人地址: JP Kyoto CN Beijing
- 专利权人: OMRON Corporation,Tsinghua University
- 当前专利权人: OMRON Corporation,Tsinghua University
- 当前专利权人地址: JP Kyoto CN Beijing
- 代理机构: Osha•Liang LLP
- 优先权: CN2004100381936 20040514
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; A61B1/04
摘要:
Unlike in the prior art in which the correspondence between a feature and a judgment value in an intended area is obtained by a single threshold value, the correspondence of the judgment value is obtained independently for each feature by use of a look-up table or the like. This makes it possible to achieve an accurate correspondence between the judgment value and the feature and thus to improve the high processing accuracy. Also, in the prior art, the judgment is repeated several times to secure the accuracy of the judgment and based on the total result thereof, the final judgment is made. Since the accuracy of each process is improved, however, the number of times the judgment is repeated is reduced for a higher processing speed.
公开/授权文献
- US20050271245A1 Specified object detection apparatus 公开/授权日:2005-12-08
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