Invention Grant
US07463826B2 Apparatus for measuring response time and method of measuring of response time using the same
有权
用于测量响应时间的装置和使用其测量响应时间的方法
- Patent Title: Apparatus for measuring response time and method of measuring of response time using the same
- Patent Title (中): 用于测量响应时间的装置和使用其测量响应时间的方法
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Application No.: US11224998Application Date: 2005-09-14
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Publication No.: US07463826B2Publication Date: 2008-12-09
- Inventor: Fusayuki Takeshita , Hiroyuki Kamiya , Kyeong-Hyeon Kim , Yong-hwan Shin , Hak-sun Chang
- Applicant: Fusayuki Takeshita , Hiroyuki Kamiya , Kyeong-Hyeon Kim , Yong-hwan Shin , Hak-sun Chang
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2004-0112127 20041224
- Main IPC: G03B17/48
- IPC: G03B17/48
Abstract:
An apparatus for measuring response time of a display apparatus including a photographing part including a charge coupled device camera and a microscope, an image processing part receiving a picture taken from a photographing part and calculating the response time thereof, and a control part applying a predetermined image signal to the display apparatus and controlling the photographing part to take a picture change of the display apparatus at a predetermined time.
Public/Granted literature
- US20060139269A1 Apparatus for measuring response time and method of measuring response time using the same Public/Granted day:2006-06-29
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