发明授权
- 专利标题: Integrated circuit including resistivity changing material element
- 专利标题(中): 集成电路,包括电阻率变化材料元素
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申请号: US11378201申请日: 2006-03-17
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公开(公告)号: US07474555B2公开(公告)日: 2009-01-06
- 发明人: Thomas Nirschl , Thomas Happ
- 申请人: Thomas Nirschl , Thomas Happ
- 代理机构: Dicke, Billig, Czaja, PLLC
- 主分类号: G11C11/00
- IPC分类号: G11C11/00
摘要:
A phase change memory cell includes a MOS select transistor having a gate coupled to a word line, and a source and drain region coupled between first and second bit lines, respectively. A first phase change element is coupled between the first bit line and the source region of the MOS select transistor. A method of reading a selected cell in the array is provided by evaluating a body effect impact of a state of the phase change element associated with the selected cell on a MOS select transistor.
公开/授权文献
- US20070217318A1 High density memory array for low power application 公开/授权日:2007-09-20
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