发明授权
- 专利标题: Examination system and examination method
- 专利标题(中): 考试制度和考试方法
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申请号: US10704647申请日: 2003-11-12
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公开(公告)号: US07477764B2公开(公告)日: 2009-01-13
- 发明人: Michael Haisch
- 申请人: Michael Haisch
- 申请人地址: DE Oberkochen
- 专利权人: Carl Zeiss Surgical GmbH
- 当前专利权人: Carl Zeiss Surgical GmbH
- 当前专利权人地址: DE Oberkochen
- 代理机构: Potomac Patent Group PLLC
- 优先权: DE10252837 20021113
- 主分类号: G06K9/00
- IPC分类号: G06K9/00 ; G01C9/00
摘要:
An examination system and a corresponding examination method, comprise: Arranging a tissue region in a vicinity of an object plane of a microscope and generating an optical image of the tissue region, receiving tissue data from a measuring head separate from the microscope, discriminating the tissue data into at least two data categories and displaying markings in the optical image of the tissue region in dependence of the discriminated data category and a relative position between a component of the microscope and the measuring head.
公开/授权文献
- US20040167742A1 Examination system and examination method 公开/授权日:2004-08-26
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