发明授权
- 专利标题: Error correction in interferometry systems
- 专利标题(中): 干涉测量系统中的误差校正
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申请号: US11246942申请日: 2005-10-06
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公开(公告)号: US07489407B2公开(公告)日: 2009-02-10
- 发明人: Henry A. Hill , Jeffrey Johnston
- 申请人: Henry A. Hill , Jeffrey Johnston
- 申请人地址: US CT Middlefield
- 专利权人: Zygo Corporation
- 当前专利权人: Zygo Corporation
- 当前专利权人地址: US CT Middlefield
- 代理机构: Fish & Richardson P.C.
- 主分类号: G01B11/02
- IPC分类号: G01B11/02
摘要:
In general, in one aspect, the invention features methods that include using an interferometer to produce an output beam having a phase related to an optical path difference between a path of a first beam and a path of a second beam, wherein the first beam contacts a measurement object and either the measurement object or the interferometer are coupled (e.g., directly attached) to a stage that is moveable within a reference frame. The methods further include monitoring variations in the phase while both varying an orientation of the stage with respect to at least one degree of freedom in the reference frame and keeping a reference mark on the stage in a common position with respect to the reference frame, and determining information based on the monitored variations, the information being related to a contribution to the optical path difference caused by a deviation of the path of the first or second beam from a nominal beam path.
公开/授权文献
- US20060072119A1 Error correction in interferometry systems 公开/授权日:2006-04-06
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