Invention Grant
- Patent Title: Error correction in interferometry systems
- Patent Title (中): 干涉测量系统中的误差校正
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Application No.: US11246942Application Date: 2005-10-06
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Publication No.: US07489407B2Publication Date: 2009-02-10
- Inventor: Henry A. Hill , Jeffrey Johnston
- Applicant: Henry A. Hill , Jeffrey Johnston
- Applicant Address: US CT Middlefield
- Assignee: Zygo Corporation
- Current Assignee: Zygo Corporation
- Current Assignee Address: US CT Middlefield
- Agency: Fish & Richardson P.C.
- Main IPC: G01B11/02
- IPC: G01B11/02

Abstract:
In general, in one aspect, the invention features methods that include using an interferometer to produce an output beam having a phase related to an optical path difference between a path of a first beam and a path of a second beam, wherein the first beam contacts a measurement object and either the measurement object or the interferometer are coupled (e.g., directly attached) to a stage that is moveable within a reference frame. The methods further include monitoring variations in the phase while both varying an orientation of the stage with respect to at least one degree of freedom in the reference frame and keeping a reference mark on the stage in a common position with respect to the reference frame, and determining information based on the monitored variations, the information being related to a contribution to the optical path difference caused by a deviation of the path of the first or second beam from a nominal beam path.
Public/Granted literature
- US20060072119A1 Error correction in interferometry systems Public/Granted day:2006-04-06
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