Invention Grant
- Patent Title: Method for calibrating infrared thermometer
- Patent Title (中): 校准红外线温度计的方法
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Application No.: US12068133Application Date: 2008-02-04
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Publication No.: US07490980B2Publication Date: 2009-02-17
- Inventor: Vincent Weng , Jason Liao , James Huang
- Applicant: Vincent Weng , Jason Liao , James Huang
- Applicant Address: TW Hsinchu
- Assignee: Radiant Innovation Inc.
- Current Assignee: Radiant Innovation Inc.
- Current Assignee Address: TW Hsinchu
- Agency: Rosenberg, Klein & Lee
- Priority: TW96104781A 20070209
- Main IPC: G01K15/00
- IPC: G01K15/00

Abstract:
The present invention discloses a method for calibrating an infrared thermometer, which can obtain a sensitivity of a radiation sensor of an infrared thermometer and a reference resistance of an ambient-temperature sensor of the infrared thermometer. The method of the present invention uses an infrared thermometer to detect two test objects respectively placed in two environments having different ambient temperatures to obtain output signals of the radiation sensor and resistances of the ambient-temperature sensor from the two test objects. Then, the method of the present invention uses the output signals of the radiation sensor and the resistances of the ambient-temperature sensor to work out the sensitivity of the radiation sensor and the reference resistance of the ambient-temperature sensor.
Public/Granted literature
- US20080192798A1 Method for calibrating infrared thermometer Public/Granted day:2008-08-14
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