Invention Grant
US07492170B2 Probe based information storage for probes used for opens detection in in-circuit testing
失效
用于在线测试中用于打开检测的探针的基于探测器的信息存储
- Patent Title: Probe based information storage for probes used for opens detection in in-circuit testing
- Patent Title (中): 用于在线测试中用于打开检测的探针的基于探测器的信息存储
-
Application No.: US11498548Application Date: 2006-08-03
-
Publication No.: US07492170B2Publication Date: 2009-02-17
- Inventor: David T. Crook , Curtis A Tesdahl
- Applicant: David T. Crook , Curtis A Tesdahl
- Applicant Address: US CA Santa Clara
- Assignee: Agilent Technologies, Inc.
- Current Assignee: Agilent Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01R31/02
Abstract:
Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.
Public/Granted literature
- US20060279295A1 Probe based information storage for probes used for opens detection in in-circuit testing Public/Granted day:2006-12-14
Information query
