发明授权
- 专利标题: Connection structure and method for fabricating the same
- 专利标题(中): 连接结构及其制造方法
-
申请号: US11544633申请日: 2006-10-10
-
公开(公告)号: US07495339B2公开(公告)日: 2009-02-24
- 发明人: Masanori Minamio , Hiroaki Fujimoto , Atsuhito Mizutani , Hisaki Fujitani , Toshiyuki Fukuda
- 申请人: Masanori Minamio , Hiroaki Fujimoto , Atsuhito Mizutani , Hisaki Fujitani , Toshiyuki Fukuda
- 申请人地址: JP Osaka
- 专利权人: Panasonic Corporation
- 当前专利权人: Panasonic Corporation
- 当前专利权人地址: JP Osaka
- 代理机构: McDermott Will & Emery LLP
- 优先权: JP2006-038443 20060215
- 主分类号: H01L23/52
- IPC分类号: H01L23/52
摘要:
There is provided a connection structure between a Si electrode (Si member) and an Al wire (Al member). Between the Si electrode and the Al wire, a first part and second parts are present in interposed relation. Each of the first and second parts is in contact with the Si electrode and with the Al wire. In the first part, a Si oxide layer and an Al oxide layer are present. The Si oxide layer is in contact with the Si electrode. The Al oxide layer is interposed between the Si oxide layer and the Al wire. In some of the second parts, Al is present. In the others of the second parts, a Si portion and an Al portion are present.
公开/授权文献
- US20070187834A1 Connection structure and method for fabricating the same 公开/授权日:2007-08-16
信息查询
IPC分类: