Invention Grant
- Patent Title: Dual function measurement system
- Patent Title (中): 双功能测量系统
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Application No.: US11609211Application Date: 2006-12-11
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Publication No.: US07495763B2Publication Date: 2009-02-24
- Inventor: Perry A. Palumbo
- Applicant: Perry A. Palumbo
- Applicant Address: US CO Loveland
- Assignee: Hach Company
- Current Assignee: Hach Company
- Current Assignee Address: US CO Loveland
- Agency: The Ollila Law Group LLC
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01J1/04
Abstract:
A measurement system having dual measurements capabilities is disclosed. The measurement system has a light source configured to provide light along a first axis that illuminates a sample media. The measurement system has a first sensor configured to measure scattered light in a sample media. The measurement system has a second sensor configured to measure light passing through the sample media.
Public/Granted literature
- US20070222985A1 Dual Function Measurement System Public/Granted day:2007-09-27
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