发明授权
- 专利标题: Etching method
- 专利标题(中): 蚀刻方法
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申请号: US11032393申请日: 2005-01-10
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公开(公告)号: US07497963B2公开(公告)日: 2009-03-03
- 发明人: Kwang-Myung Lee , Ki-Young Yun , Seung-Ki Chae , No-Hyun Huh , Wan-Goo Hwang , Jung-Hyun Hwang , Shinji Yanagisawa , Kengo Tsutsumi , Seiichi Takahashi
- 申请人: Kwang-Myung Lee , Ki-Young Yun , Seung-Ki Chae , No-Hyun Huh , Wan-Goo Hwang , Jung-Hyun Hwang , Shinji Yanagisawa , Kengo Tsutsumi , Seiichi Takahashi
- 申请人地址: KR Kyungki-Do JP Kanagawa-Ken
- 专利权人: Samsung Electronics Co., Ltd.,ULVAC, Inc.
- 当前专利权人: Samsung Electronics Co., Ltd.,ULVAC, Inc.
- 当前专利权人地址: KR Kyungki-Do JP Kanagawa-Ken
- 代理机构: Grossman, Tucker, Perreault & Pfleger, PLLC
- 优先权: JPP2004-005219 20040113
- 主分类号: B44C1/22
- IPC分类号: B44C1/22
摘要:
In this etching method, since an etching gas is introduced before introduction of free radicals into a processing chamber, the etching gas has been adsorbed on the surface of substrates when the free radicals are introduced. Accordingly, the free radicals react with the etching gas adsorbed on the surface of the substrates, and the reaction proceeds uniformly on the surface of the substrate. As a result, nonuniform etching does not occur on the surface of the substrate. Moreover, since the reaction between the etching gas and the free radicals occurs on the surface of the substrate, an intermediate product produced according to the reaction between the etching gas and the free radicals reacts with an etching object promptly. Therefore, the intermediate product is not exhausted from the processing chamber 12 excessively, and hence the etching efficiency is high. As a result, according to this etching method, not only the in-plane distribution of the etching amount becomes more uniform, but also the etching rate is increased more than in the conventional etching method.
公开/授权文献
- US20050153553A1 Etching method 公开/授权日:2005-07-14
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